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Infrared characterization for microelectronics / W.S. Lau.

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Material type: Text

TextPublication details: Singapore ; River Edge, NJ : World Scientific, c1999.Description: x, 160 p. : ill. ; 23 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Institute of Applied Problems of Physics	General	621.381 (Browse shelf(Opens below))	Available		APP2008

Includes bibliographical references and index.

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