Normal view MARC view ISBD view

Методы измерения параметров полупроводниковых приборов / Пер. с англ. М.И.Иглицына

Contributor(s):

Material type: Text

TextLanguage: Russian Publication details: Москва : Оборонгиз , 1961.Description: 264 сOther title:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Institute of Radiophysics & Electronics	General	621.382 M 545 (Browse shelf(Opens below))	Available		IRE7819

Библиогр.:в конце глав

There are no comments on this title.

to post a comment.