| 000 | 00951cam a22002774a 4500 | ||
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| 001 | 11769796 | ||
| 003 | CONS | ||
| 005 | 20230315174748.0 | ||
| 008 | 990811s1999 si a b 001 0 eng | ||
| 010 | _a99044781 | ||
| 020 | _a9810223528 | ||
| 040 |
_aAPP _cAPP _dDLC |
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| 042 | _apcc | ||
| 082 | 0 | 0 |
_a621.381 _221 |
| 100 | 1 | _aLau, W. S. | |
| 245 | 1 | 0 |
_aInfrared characterization for microelectronics / _cW.S. Lau. |
| 260 |
_aSingapore ; _aRiver Edge, NJ : _bWorld Scientific, _cc1999. |
||
| 300 |
_ax, 160 p. : _bill. ; _c23 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aMicroelectronics _xMaterials _xTesting. |
|
| 650 | 0 | _aInfrared spectroscopy. | |
| 650 | 0 | _aAbsorption spectra. | |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
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| 942 |
_2udc _cBK |
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