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Анализ поверхности методом оже- и рентгеновcкой фотоэлектронной спектроскопии / Под ред. Д. Бриггса, М.П. Сиха; Пер. с англ. под ред. В.И. Раховского, И.С. Реза

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Material type: Text

TextLanguage: Russian Original language: English Publication details: Москва : Мир, 1987.Description: 600 с. : илOther title:

Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy [Parallel title]

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Institute of Geophysics and Engineering Seismology	General	535/А64 (Browse shelf(Opens below))	Available		GES13584

Библиогр.: в конце гл.

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