TY  - BOOK
AU  - Lau,W.S.
TI  - Infrared characterization for microelectronics
SN  - 9810223528
U1  - 621.381 21
PY  - 1999///
CY  - Singapore, River Edge, NJ
PB  - World Scientific
KW  - Microelectronics
KW  - Materials
KW  - Testing
KW  - Infrared spectroscopy
KW  - Absorption spectra
N1  - Includes bibliographical references and index
ER  -