Lau, W. S. <br/><br/>
Infrared characterization for microelectronics / 
W.S. Lau. 
 - Singapore ;  River Edge, NJ :  World Scientific,  c1999. 
 - x, 160 p. :  ill. ;  23 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9810223528 
<br/><br/><label>LCCN: </label>99044781  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Materials--Testing.<br/>Infrared spectroscopy.<br/>Absorption spectra.
<br/><br/><label>Dewey Class. No.: </label>621.381